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Timeline
Attention over time
Attention Score history
Activity
Mendeley demographics
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| Title |
A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults
|
|---|---|
| Published by |
Institute of Electrical and Electronics Engineers (IEEE), January 2006
|
| DOI | 10.1109/ets.2006.8 |
| Authors |
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Mendeley demographics
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 2 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Bachelor | 1 | 50% |
| Student > Master | 1 | 50% |
| Readers by discipline | Count | As % |
|---|---|---|
| Computer Science | 1 | 50% |
| Psychology | 1 | 50% |