At-Speed BIST for Interposer Wires Supporting On-the-Spot Diagnosis

Overview of attention for article published in this source, July 2013

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Multi-layer integrated circuits having isolation cells for layer testing and related…

Grant US-10838003-B2

United States of America

Electronic device including integrated circuit with debug capabilities

Grant US-10656202-B1

United States of America

Multi-layer integrated circuits having isolation cells for layer testing and related…

Grant US-10338133-B2

United States of America

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