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Low-Voltage Embedded NAND-ROM Macros Using Data-Aware Sensing Reference Scheme for VDDmin, Speed and Power Improvement

Overview of attention for article published in IEEE Journal of Solid-State Circuits, January 2013
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Article details
Title
Low-Voltage Embedded NAND-ROM Macros Using Data-Aware Sensing Reference Scheme for VDDmin, Speed and Power Improvement
Published in
IEEE Journal of Solid-State Circuits, January 2013
DOI 10.1109/jssc.2012.2229068
Authors

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Mendeley demographics

Mendeley demographics

The data shown below were compiled from readership statistics for 20 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Geographical breakdown
Country Count As %
Hong Kong 1 5%
Unknown 19 95%

Demographic breakdown

Readers by professional status
Readers by professional status Count As %
Student > Master 5 25%
Other 3 15%
Student > Ph. D. Student 3 15%
Student > Doctoral Student 2 10%
Student > Bachelor 2 10%
Other 2 10%
Unknown 3 15%
Readers by discipline
Readers by discipline Count As %
Engineering 15 75%
Physics and Astronomy 1 5%
Design 1 5%
Unknown 3 15%