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Timeline
Attention over time
Attention Score history
Mendeley demographics
| Title |
A fast and sensitive built-in current sensor for IDDQ testing
|
|---|---|
| Published by |
Institute of Electrical and Electronics Engineers (IEEE), January 1996
|
| DOI | 10.1109/iddq.1996.557816 |
| Authors |
Chih-Wen Lu, Chung Len Lee, Jwu-E Chen |
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Mendeley demographics
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 2 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 1 | 50% |
| Student > Master | 1 | 50% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 2 | 100% |