You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Timeline
Attention over time
Attention Score history
Mendeley demographics
| Title |
Built-In Self-Test for Manufacturing TSV Defects before Bonding**This work was conducted in the framework of the Catrene CT312 MASTER3D project and received financial support from the “Ministere du Redressement Productif”.
|
|---|---|
| Published by |
Institute of Electrical and Electronics Engineers (IEEE), April 2014
|
| DOI | 10.1109/vts.2014.6818771 |
| Authors |
Login to access the Attention Digest and the Sentiment Analysis related to this output.
Mendeley demographics
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 3 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Professor > Associate Professor | 1 | 33% |
| Researcher | 1 | 33% |
| Student > Postgraduate | 1 | 33% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 2 | 67% |
| Computer Science | 1 | 33% |