Improving scan chain diagnostic accuracy using multi-stage artificial neural networks

Overview of attention for article published in this source, January 2019

Altmetric Badge

Mentioned by

patent: 1 patent

Readers on

mendeley: 6 Mendeley

So far, Altmetric has seen 1 patent that references this research output.

System and method for optimizing fault coverage based on optimized test point insertion…

Grant US-12306247-B2

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.