A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals

Overview of attention for article published in this source, January 2005

Altmetric Badge

Mentioned by

patent: 1 patent

Readers on

mendeley: 6 Mendeley

So far, Altmetric has seen 1 patent that references this research output.

Scan test circuitry with selectable transition launch mode

Grant US-8751884-B2

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.