Manufacturing intelligence for reducing false alarm of defect classification by integrating similarity matching approach in CMOS image sensor manufacturing
Published in
Computers & Industrial Engineering, September 2016
This research output has an Altmetric Attention Score of 3. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 08 March 2024.
All research outputs
#11,253,706
of 31,930,814 outputs
Outputs from Computers & Industrial Engineering
#194
of 1,110 outputs
Outputs of similar age
#124,468
of 326,239 outputs
Outputs of similar age from Computers & Industrial Engineering
#4
of 7 outputs
Altmetric has tracked 31,930,814 research outputs across all sources so far. This one is in the 39th percentile – i.e., 39% of other outputs scored the same or lower than it.
So far Altmetric has tracked 1,110 research outputs from this source. They receive a mean Attention Score of 3.4. This one is in the 45th percentile – i.e., 45% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 326,239 tracked outputs that were published within six weeks on either side of this one in any source. This one is in the 45th percentile – i.e., 45% of its contemporaries scored the same or lower than it.
We're also able to compare this research output to 7 others from the same source and published within six weeks on either side of this one. This one has scored higher than 3 of them.
