↓ Skip to main content

A Simple Marker-Assisted 3D Nanometer Drift Correction Method for Superresolution Microscopy

Overview of attention for article published in Biophysical Journal, May 2017
Altmetric Badge

About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • High Attention Score compared to outputs of the same age (84th percentile)
  • High Attention Score compared to outputs of the same age and source (87th percentile)

Mentioned by

twitter
5 X users
patent
8 patents
facebook
3 Facebook pages

Readers on

mendeley
68 Mendeley