A Simple Marker-Assisted 3D Nanometer Drift Correction Method for Superresolution Microscopy

Overview of attention for article published in Biophysical Journal, May 2017

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In the top 25% of all research outputs scored by Altmetric
High Attention Score compared to outputs of the same age (84th percentile)
High Attention Score compared to outputs of the same age and source (87th percentile)

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twitter: 5 X users
patent: 8 patents

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So far, Altmetric has seen 8 patents that reference this research output.

DRIFT-FREE-HIGH-THROUGHPUT LOCALIZATION MICROSCOPY

Application US-20260094456-A1

United States of America

02 Apr 2026

Automated nanoscopy system having integrated artifact minimization modules, including…

Grant US-12567268-B2

United States of America

03 Mar 2026

High speed tracking of IOL during refractive index modification

Grant AU-2020272233-B2

Australia

14 Aug 2025

High speed tracking of IOL during refractive index modification

Grant US-12350199-B2

United States of America

08 Jul 2025

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