Method, apparatus, storage medium and program product for controlling IR drop of chip Application CN-120821500-A China 21 Oct 2025
Method for near-field measurement of electromagnetic emissions in the time domain Grant DE-102009035421-B4 Germany 02 Jul 2020
Method for measuring near-field dispersion of electromagnetic transient emissions of… Application DE-102009035421-A1 Germany 03 Feb 2011