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Local Binary Patterns as a Feature Descriptor in Alignment-Free Visualisation of Metagenomic Data

Overview of attention for article published in this source, December 2016
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1 X user

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8 Mendeley
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Article details
Title
Local Binary Patterns as a Feature Descriptor in Alignment-Free Visualisation of Metagenomic Data
Published by
Institute of Electrical and Electronics Engineers (IEEE), December 2016
DOI 10.1109/ssci.2016.7849955
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X Demographics

X Demographics

The data shown below were collected from the profile of 1 X user who shared this research output. Click here to find out more about how the information was compiled.
Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 8 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Geographical breakdown
Country Count As %
Unknown 8 100%

Demographic breakdown

Readers by professional status
Readers by professional status Count As %
Student > Master 4 50%
Professor > Associate Professor 1 13%
Student > Bachelor 1 13%
Student > Doctoral Student 1 13%
Unknown 1 13%
Readers by discipline
Readers by discipline Count As %
Computer Science 4 50%
Biochemistry, Genetics and Molecular Biology 1 13%
Linguistics 1 13%
Agricultural and Biological Sciences 1 13%
Unknown 1 13%