VLSI Test Principles and Architectures
Elsevier
| Title |
VLSI Test Principles and Architectures
|
|---|---|
| Published by |
Elsevier, January 2006
|
| DOI | 10.1016/b978-0-12-370597-6.x5000-8 |
| ISBNs |
978-0-12-370597-6
|
| Country | Count | As % |
|---|---|---|
| Netherlands | 1 | 2% |
| Japan | 1 | 2% |
| China | 1 | 2% |
| Unknown | 42 | 93% |
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 13 | 29% |
| Student > Master | 13 | 29% |
| Student > Bachelor | 3 | 7% |
| Other | 2 | 4% |
| Researcher | 2 | 4% |
| Other | 3 | 7% |
| Unknown | 9 | 20% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 23 | 51% |
| Computer Science | 7 | 16% |
| Environmental Science | 1 | 2% |
| Business, Management and Accounting | 1 | 2% |
| Nursing and Health Professions | 1 | 2% |
| Other | 1 | 2% |
| Unknown | 11 | 24% |