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Optimal Core Wrapper Width Selection and SOC Test Scheduling Based on 3-D Bin Packing Algorithm

Overview of attention for article published in this source, January 2002
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Article details
Title
Optimal Core Wrapper Width Selection and SOC Test Scheduling Based on 3-D Bin Packing Algorithm
Published by
Institute of Electrical and Electronics Engineers (IEEE), January 2002
DOI 10.1109/test.2002.1041747
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Mendeley demographics

Mendeley demographics

The data shown below were compiled from readership statistics for 13 Mendeley readers of this research output. Click here to see the associated Mendeley record.
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Geographical breakdown

Geographical breakdown
Country Count As %
Taiwan 1 8%
Japan 1 8%
Unknown 11 85%

Demographic breakdown

Readers by professional status
Readers by professional status Count As %
Student > Ph. D. Student 5 38%
Student > Master 2 15%
Other 1 8%
Professor 1 8%
Student > Postgraduate 1 8%
Other 0 0%
Unknown 3 23%
Readers by discipline
Readers by discipline Count As %
Engineering 10 77%
Unknown 3 23%