Scan Chain Encryption for the Test, Diagnosis and Debug of Secure Circuits

Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, et al.. Scan chain encryption for the test, diagnosis and debug of secure circuits. ETS: European Test Symposium, May 2017, Limassol, Cyprus. IEEE, 22nd IEEE European

HAL Archives-Ouvertes, 02 Feb 2018

Mathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, et al..