The HOY Tester-Can IC Testing Go Wireless?

Overview of attention for article published in this source, April 2006

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Method and apparatus for interrogating electronic equipment components

Grant US-8829934-B2

United States of America

System and method for wirelessly testing integrated circuits

Grant US-8792835-B2

United States of America

Method and apparatus for interrogating an electronic component

Grant US-8390307-B2

United States of America

Method and apparatus for interrogating an electronic component

Grant US-8373429-B2

United States of America

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