↓ Skip to main content

A new technique for the scanning and absolute calibration of electron energy loss spectra

Overview of attention for article published in Ultramicroscopy, January 1981
Altmetric Badge

About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • High Attention Score compared to outputs of the same age (94th percentile)
  • High Attention Score compared to outputs of the same age and source (86th percentile)

Mentioned by

patent
5 patents

Readers on

mendeley
3 Mendeley