Contour-Based Structure from Reflection

Overview of attention for article published in this source, January 2006

Altmetric Badge

Mentioned by

patent: 4 patents

Readers on

mendeley: 6 Mendeley

So far, Altmetric has seen 4 patents that reference this research output.

METHOD OF CAMERA CALIBRATION FOR A MULTI-CAMERA SYSTEM AND APPARATUS PERFORMING THE SAME

Application EP-3166074-A1

European Patent Office

METHOD OF CAMERA CALIBRATION FOR A MULTI-CAMERA SYSTEM AND APPARATUS PERFORMING THE SAME

Application EP-3086285-A1

European Patent Office

SYSTEM, APPARATUS AND METHOD FOR MOVIE CAMERA PLACEMENT BASED ON A MANUSCRIPT

Application US-20160162154-A1

United States of America

SYSTEM, APPARATUS AND METHOD FOR MOVIE CAMERA PLACEMENT BASED ON A MANUSCRIPT

Application WO-2014207565-A3

World Intellectual Property Organisation (WIPO)

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.