An instrument for time-resolved and anomalous simultaneous small- and wide-angle X-ray scattering (SWAXS) at NSRRC

Overview of attention for article published in Journal of Applied Crystallography (Wiley-Blackwell), November 2006

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patent: 3 patents

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So far, Altmetric has seen 3 patents that reference this research output.

DEVICE AND METHOD FOR ANALYZING NANOPARTICLES BY COMBINATION OF FIELD-FLOW FRACTIONATION…

Grant EP-2279404-B1

European Patent Office

DEVICE FOR MEASURING A DELEGATION DEGREE AND METHOD OF USING SAID DEVICE.

Application FR-2969749-A1

France

DEVICE FOR MEASURING A DEGREE OF MISALIGNMENT, AND METHOD FOR USING SAID DEVICE

Application WO-2012085401-A1

World Intellectual Property Organisation (WIPO)

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