A Neural-Network Approach for Semiconductor Wafer Post-Sawing Inspection

Overview of attention for article published in IEEE Transactions on Semiconductor Manufacturing, May 2002

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patent: 6 patents

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So far, Altmetric has seen 6 patents that reference this research output.

Method and system for mapping objects on unknown specimens

Grant US-12174361-B2

United States of America

24 Dec 2024

Method and system for mapping objects on unknown specimens

Grant US-11815673-B2

United States of America

14 Nov 2023

Method and system for mapping objects on unknown specimens

Grant US-11333876-B2

United States of America

17 May 2022

Method and system for automatically mapping fluid objects on a substrate

Grant US-10809516-B2

United States of America

20 Oct 2020

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