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Timeline
Attention over time
Attention Score history
Activity
Mendeley demographics
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| Title |
CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing
|
|---|---|
| Published by |
Institute of Electrical and Electronics Engineers (IEEE), November 2008
|
| DOI | 10.1109/ats.2008.27 |
| Authors |
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Mendeley demographics
The data shown below were compiled from readership statistics for 4 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 4 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Master | 2 | 50% |
| Other | 1 | 25% |
| Student > Doctoral Student | 1 | 25% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 3 | 75% |
| Unknown | 1 | 25% |