Spectral histogram using the minimization algorithm-theory and applications to flaw detection

Overview of attention for article published in IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, June 2012

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In the top 25% of all research outputs scored by Altmetric
High Attention Score compared to outputs of the same age (84th percentile)
High Attention Score compared to outputs of the same age and source (88th percentile)

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patent: 3 patents

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mendeley: 2 Mendeley

So far, Altmetric has seen 3 patents that reference this research output.

METHOD AND DEVICE FOR DETERMINING THE STRUCTURAL ORGANIZATION OF AN OBJECT, PARTICULARLY…

Application WO-2011113847-A1

World Intellectual Property Organisation (WIPO)

Method and device for determining local characteristics of an object, particularly with…

Application EP-2169424-A1

European Patent Office

Methods for determining optical properties of optical waveguide fibers using an optical…

Grant US-5479251-A

United States of America

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