Temperature Sensing Scheme Through Random Telegraph Noise in Contact RRAM

Overview of attention for article published in IEEE Electron Device Letters, December 2012

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In the top 25% of all research outputs scored by Altmetric
High Attention Score compared to outputs of the same age (86th percentile)
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patent: 3 patents

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mendeley: 9 Mendeley

So far, Altmetric has seen 3 patents that reference this research output.

For determining the method and apparatus to the Integrated circuit portion of random…

Application CN-107923940-A

China

Random telegraph signal identification and measurement

Grant US-9723578-B2

United States of America

METHOD AND APPARATUS FOR IDENTIFYING SENSITIVE INTEGRATED CIRCUIT PARTS TO RANDOM…

Application WO-2016198475-A1

World Intellectual Property Organisation (WIPO)

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