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Timeline
Attention over time
Attention Score history
Activity
Mendeley demographics
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| Title |
Multi-Visit TAMs to Reduce the Post-Bond Test Length of 2.5D-SICs with a Passive Silicon Interposer Base
|
|---|---|
| Published by |
Institute of Electrical and Electronics Engineers (IEEE), November 2011
|
| DOI | 10.1109/ats.2011.36 |
| Authors |
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Mendeley demographics
The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| France | 1 | 14% |
| Unknown | 6 | 86% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Lecturer | 2 | 29% |
| Student > Ph. D. Student | 2 | 29% |
| Other | 1 | 14% |
| Student > Master | 1 | 14% |
| Researcher | 1 | 14% |
| Other | 0 | 0% |
| Readers by discipline | Count | As % |
|---|---|---|
| Computer Science | 2 | 29% |
| Economics, Econometrics and Finance | 2 | 29% |
| Engineering | 2 | 29% |
| Unknown | 1 | 14% |