X-ray diffraction as a tool for the determination of the structure of double-walled carbon nanotube batches

Overview of attention for article published in Physical Review B: Condensed Matter and Materials Physics, May 2009

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In the top 25% of all research outputs scored by Altmetric
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Julien Cambedouzou, Matthieu Chorro, Robert Almairac, Laure Noé, Emmanuel Flahaut, et al..

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