| Title |
Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysis
|
|---|---|
| Published in |
Review of Scientific Instruments, April 2012
|
| DOI | 10.1063/1.3701831 |
| Pubmed ID | |
| Authors | |
| Abstract |
We present the development and characterization of a dedicated resonant soft x-ray scattering facility. Capable of operation over a wide energy range, the beamline and endstation are primarily used for scattering from soft matter systems around the carbon K-edge (∼285 eV). We describe the specialized design of the instrument and characteristics of the beamline. Operational characteristics of immediate interest to users such as polarization control, degree of higher harmonic spectral contamination, and detector noise are delineated. Of special interest is the development of a higher harmonic rejection system that improves the spectral purity of the x-ray beam. Special software and a user-friendly interface have been implemented to allow real-time data processing and preliminary data analysis simultaneous with data acquisition. |
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X Demographics
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Italy | 1 | 50% |
| United States | 1 | 50% |
Demographic breakdown
| Type | Count | As % |
|---|---|---|
| Scientists | 2 | 100% |
Mendeley demographics
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| United States | 3 | 2% |
| United Kingdom | 1 | <1% |
| Unknown | 159 | 98% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 55 | 34% |
| Researcher | 34 | 21% |
| Student > Master | 13 | 8% |
| Student > Bachelor | 9 | 6% |
| Professor | 8 | 5% |
| Other | 11 | 7% |
| Unknown | 33 | 20% |
| Readers by discipline | Count | As % |
|---|---|---|
| Physics and Astronomy | 38 | 23% |
| Chemistry | 32 | 20% |
| Materials Science | 28 | 17% |
| Engineering | 10 | 6% |
| Chemical Engineering | 8 | 5% |
| Other | 7 | 4% |
| Unknown | 40 | 25% |