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Fast Axial-Scanning Widefield Microscopy with Constant Magnification and Resolution

Overview of attention for article published in Journal of Display Technology, February 2015
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About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • One of the highest-scoring outputs from this source (#3 of 373)
  • High Attention Score compared to outputs of the same age (89th percentile)
  • High Attention Score compared to outputs of the same age and source (91st percentile)

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