Fast Axial-Scanning Widefield Microscopy with Constant Magnification and Resolution

Overview of attention for article published in Journal of Display Technology, February 2015

Altmetric Badge

About this Attention Score

In the top 25% of all research outputs scored by Altmetric
One of the highest-scoring outputs from this source (#3 of 373)
High Attention Score compared to outputs of the same age (89th percentile)
High Attention Score compared to outputs of the same age and source (91st percentile)

Mentioned by

news: 1 news outlet

patent: 5 patents

Readers on

mendeley: 56 Mendeley

So far, Altmetric has seen 5 patents that reference this research output.

FLUORESCENCE MICROSCOPY SYSTEM, LASER DIAGNOSTIC SYSTEM, AND FLUORESCENCE IMAGING METHOD

Application WO-2025252560-A1

World Intellectual Property Organisation (WIPO)

11 Dec 2025

Fluorescence microscopy system, laser diagnostic system, and fluorescence imaging process

Application FR-3162867-A1

France

05 Dec 2025

METHOD AND APPARATUS FOR AUTOFOCUSSING AN OPTICAL MICROSCOPE AND DYNAMIC FOCUS TRACKING

Application US-20200355900-A1

United States of America

12 Nov 2020

Systems and methods for lightfield reconstruction utilizing contribution regions

Grant US-10460505-B2

United States of America

29 Oct 2019

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity, including 1 additional patents.