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Wafer-scale MoS 2 thin layers prepared by MoO 3 sulfurization

Overview of attention for article published in Nanoscale, January 2012
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About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • High Attention Score compared to outputs of the same age (95th percentile)
  • High Attention Score compared to outputs of the same age and source (98th percentile)

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