Impact of STI Effect on Flicker Noise in 0.13-$\mu \hbox{m}$ RF nMOSFETs
Overview of attention for article published in IEEE Transactions on Electron Devices, December 2007
Altmetric Badge
About this Attention Score
-
In the top 25% of all research outputs scored by Altmetric
-
High Attention Score compared to outputs of the same age (92nd percentile)
-
High Attention Score compared to outputs of the same age and source (96th percentile)
Readers on
- mendeley
- 14 Mendeley