Nondestructive testing of microstructures by picosecond ultrasonics

Overview of attention for article published in Journal of Nondestructive Evaluation, December 1990

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Among the highest-scoring outputs from this source (#37 of 242)

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So far, Altmetric has seen 15 patents that reference this research output.

Electro-optic sensor

Grant US-7463364-B2

United States of America

09 Dec 2008

Optical stress generator and detector

Grant US-6400449-B2

United States of America

04 Jun 2002

Optical stress generator and detector

Grant US-6271921-B1

United States of America

07 Aug 2001

Optical method for the characterization of the electrical properties of semiconductors…

Grant US-6211961-B1

United States of America

03 Apr 2001

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