Fault-Tolerance Considerations in Large, Multiple-Processor Systems

Overview of attention for article published in Computer, March 1986

Altmetric Badge

Mentioned by

patent: 1 patent

Readers on

mendeley: 4 Mendeley

So far, Altmetric has seen 1 patent that references this research output.

Apparatus and method for event correlation and problem reporting

Grant US-6249755-B1

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.