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Timeline
Attention over time
Attention Score history
Activity
Mendeley demographics
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| Title |
Clustered defects in IC fabrication: Impact on process control charts
|
|---|---|
| Published in |
IEEE Transactions on Semiconductor Manufacturing, January 1991
|
| DOI | 10.1109/66.75850 |
| Authors |
D.J. Friedman, S.L. Albin |
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Mendeley demographics
The data shown below were compiled from readership statistics for 8 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 8 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Other | 2 | 25% |
| Professor | 2 | 25% |
| Student > Bachelor | 1 | 13% |
| Student > Ph. D. Student | 1 | 13% |
| Student > Postgraduate | 1 | 13% |
| Other | 0 | 0% |
| Unknown | 1 | 13% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 4 | 50% |
| Computer Science | 1 | 13% |
| Unknown | 3 | 38% |