A March Test for Functional Faults in Semiconductor Random Access Memories

Overview of attention for article published in IEEE Transactions on Computers, August 2006

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patent: 5 patents

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So far, Altmetric has seen 5 patents that reference this research output.

Programmable test for memories

Grant US-7093176-B2

United States of America

15 Aug 2006

Method and system for fault coverage testing memory

Grant US-5537632-A

United States of America

16 Jul 1996

Input/output checker for a memory array

Grant US-5459733-A

United States of America

17 Oct 1995

Fault locator architecture and method for memories

Grant US-5357471-A

United States of America

18 Oct 1994

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