On correction of multiple design errors

Overview of attention for article published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, January 1995

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So far, Altmetric has seen 6 patents that reference this research output.

Compactor independent fault diagnosis

Grant US-8301414-B2

United States of America

Compactor independent direct diagnosis of test hardware

Grant US-8280688-B2

United States of America

Direct fault diagnostics using per-pattern compactor signatures

Grant US-8280687-B2

United States of America

Compactor independent direct diagnosis of test hardware

Grant US-7729884-B2

United States of America

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