Finite Memory Test Response Compactors for Embedded Test Applications

Overview of attention for article published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, April 2005

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So far, Altmetric has seen 6 patents that reference this research output.

Reducing X-masking effect for linear time compactors

Grant US-10908213-B1

United States of America

Selective per-cycle masking of scan chains for system level test

Grant US-9874606-B2

United States of America

Selective per-cycle masking of scan chains for system level test

Grant US-9377508-B2

United States of America

Selective per-cycle masking of scan chains for system level test

Grant US-8726113-B2

United States of America

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