High defect coverage with low-power test sequences in a BIST environment

Overview of attention for article published in IEEE Design & Test of Computers, September 2002

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So far, Altmetric has seen 9 patents that reference this research output.

Low power compression of incompatible test cubes

Grant US-8832512-B2

United States of America

Test generator for low power built-in self-test

Grant US-8683280-B2

United States of America

Decompressors for low power decompression of test patterns

Grant US-8301945-B2

United States of America

Low power decompression of test cubes

Grant US-8046653-B2

United States of America

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