Definition and generation of partially-functional broadside tests

Overview of attention for article published in IET Computers & Digital Techniques, January 2009

Altmetric Badge

Mentioned by

patent: 2 patents

Readers on

mendeley: 3 Mendeley

So far, Altmetric has seen 2 patents that reference this research output.

Synthesis for random testability using unreachable states in integrated circuits

Grant US-10502782-B2

United States of America

At-speed scan testing with controlled switching activity

Grant US-8499209-B2

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.