Optimal Double via Insertion with On-Track Preference

Overview of attention for article published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, February 2010

Altmetric Badge

Mentioned by

patent: 2 patents

Readers on

mendeley: 2 Mendeley

So far, Altmetric has seen 2 patents that reference this research output.

Method and apparatus of an integrated circuit

Grant US-8689160-B2

United States of America

Method and apparatus of an integrated circuit

Grant US-8522186-B2

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.