Swept volumes: void and boundary identification

Overview of attention for article published in Computer-Aided Design, November 1998

Altmetric Badge

Mentioned by

patent: 1 patent

Readers on

mendeley: 14 Mendeley

So far, Altmetric has seen 1 patent that references this research output.

Method and system for identifying proximity areas between several digitally simulated…

Grant US-7774180-B2

United States of America

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.