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Embedded totally self-checking checkers: a practical design

Overview of attention for article published in IEEE Design & Test of Computers, August 1990
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About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • Among the highest-scoring outputs from this source (#31 of 560)
  • High Attention Score compared to outputs of the same age (86th percentile)

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