Microstructure informatics using higher-order statistics and efficient data-mining protocols

Overview of attention for article published in JOM, April 2011

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patent: 3 patents

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mendeley: 172 Mendeley

So far, Altmetric has seen 3 patents that reference this research output.

Inspection of machined holes

Grant US-10295475-B2

United States of America

Machine tool monitoring

Grant US-10228669-B2

United States of America

Identification and quantification of microtextured regions in materials with ordered…

Grant US-9070203-B2

United States of America

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