Guest editorial for the Special Issue on signal and power integrity of microelectronic networks through modelling and simulation of fields and devices

Overview of attention for article published in International Journal of Numerical Modelling, May 2018

Altmetric Badge

Mentioned by

So far, Altmetric has seen 1 public wall post.

New from the International Journal of Numerical Modelling - Special Issue on "Signal and Power Integrity of Microelectronic…

This page shows the most recent Facebook posts that mention this research output. Click here to find out how to access more activity.