Twin-bit via resistive random access memory in 16 nm FinFET logic technologies

Overview of attention for article published in Japanese Journal of Applied Physics, March 2018

Altmetric Badge

About this Attention Score

Above-average Attention Score compared to outputs of the same age and source (53rd percentile)

So far, Altmetric has seen 1 X post from an account with 273 followers.

This page shows the most recent X posts that mention this research output. Click here to find out how to access more activity.