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Hard X-rays for processing hybrid organic–inorganic thick films

Overview of attention for article published in Journal of Synchrotron Radiation (International Union of Crystallography - IUCr), January 2016
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Article details
Title
Hard X-rays for processing hybrid organic–inorganic thick films
Published in
Journal of Synchrotron Radiation (International Union of Crystallography - IUCr), January 2016
DOI 10.1107/s1600577515018597
Pubmed ID
Authors
Abstract

Hard X-rays, deriving from a synchrotron light source, have been used as an effective tool for processing hybrid organic-inorganic films and thick coatings up to several micrometres. These coatings could be directly modified, in terms of composition and properties, by controlled exposure to X-rays. The physico-chemical properties of the coatings, such as hardness, refractive index and fluorescence, can be properly tuned using the interaction of hard X-rays with the sol-gel hybrid films. The changes in the microstructure have been correlated especially with the modification of the optical and the mechanical properties. A relationship between the degradation rate of the organic groups and the rise of fluorescence from the hybrid material has been observed; nanoindentation analysis of the coatings as a function of the X-ray doses has shown a not linear dependence between thickness and film hardness.

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Mendeley demographics

Mendeley demographics

The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.
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Geographical breakdown

Geographical breakdown
Country Count As %
Unknown 7 100%

Demographic breakdown

Readers by professional status
Readers by professional status Count As %
Researcher 3 43%
Student > Postgraduate 1 14%
Student > Doctoral Student 1 14%
Unknown 2 29%
Readers by discipline
Readers by discipline Count As %
Chemistry 3 43%
Materials Science 3 43%
Unknown 1 14%
Attention Score in Context

Attention Score in Context

This research output has an Altmetric Attention Score of 1. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 06 December 2015.
All research outputs
#28,603,920
of 34,363,559 outputs
Outputs from Journal of Synchrotron Radiation (International Union of Crystallography - IUCr)
#1,692
of 2,711 outputs
Outputs of similar age
#350,072
of 446,163 outputs
Outputs of similar age from Journal of Synchrotron Radiation (International Union of Crystallography - IUCr)
#30
of 69 outputs
Altmetric has tracked 34,363,559 research outputs across all sources so far. This one is in the 9th percentile – i.e., 9% of other outputs scored the same or lower than it.
So far Altmetric has tracked 2,711 research outputs from this source. They receive a mean Attention Score of 2.5. This one is in the 1st percentile – i.e., 1% of its peers scored the same or lower than it.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 446,163 tracked outputs that were published within six weeks on either side of this one in any source. This one is in the 11th percentile – i.e., 11% of its contemporaries scored the same or lower than it.
We're also able to compare this research output to 69 others from the same source and published within six weeks on either side of this one. This one is in the 1st percentile – i.e., 1% of its contemporaries scored the same or lower than it.