A multilayer edge-on single photon counting silicon microstrip detector for innovative imaging techniques in diagnostic radiology
Overview of attention for article published in Review of Scientific Instruments, July 2003
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In the top 25% of all research outputs scored by Altmetric
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High Attention Score compared to outputs of the same age (92nd percentile)
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High Attention Score compared to outputs of the same age and source (94th percentile)
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