The Design of LLVM-Based Shader Compiler for Embedded Architecture

Overview of attention for article published in this source, December 2014

Altmetric Badge

Mentioned by

patent: 4 patents

Readers on

mendeley: 5 Mendeley

So far, Altmetric has seen 4 patents that reference this research output.

Removing or identifying overlapping fragments after z-culling

Grant US-10943389-B2

United States of America

Overlapping fragments are removed or identified after Z- rejecting

Application CN-110036414-A

China

REMOVING OR IDENTIFYING OVERLAPPING FRAGMENTS AFTER Z-CULLING

Application WO-2018106422-A1

World Intellectual Property Organisation (WIPO)

REMOVING OR IDENTIFYING OVERLAPPING FRAGMENTS AFTER Z-CULLING

Application EP-3333805-A1

European Patent Office

This page shows the most recent patents that mention this research output. Click here to find out how to access more activity.