A complex eIF4E locus impacts the durability of va resistance to Potato virus Y in tobacco

Overview of attention for article published in Molecular Plant Pathology, May 2019

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In the top 25% of all research outputs scored by Altmetric
Good Attention Score compared to outputs of the same age (77th percentile)
Good Attention Score compared to outputs of the same age and source (75th percentile)

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A complex eIF4E locus impacts the durability of va resistance to Potato virus Y in tobacco. https://t.co/y0iZGwch2m https://t.co/qdmsSBC6yr

A complex eIF4E locus impacts the durability of va resistance to Potato virus Y in tobacco. https://t.co/SXyaIeCeSr

RT @INRA_PV: #OurNewPaper in @MPPjournal A complex eIF4E locus impacts the durability of va resistance to Potato #Virus Y in tobacco. #Plan…

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