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Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences

Overview of attention for article published in Journal of Electronic Testing, June 2001
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About this Attention Score

  • In the top 25% of all research outputs scored by Altmetric
  • One of the highest-scoring outputs from this source (#3 of 123)
  • High Attention Score compared to outputs of the same age (84th percentile)

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1 news outlet

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mendeley
3 Mendeley
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