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Timeline
Attention over time
Attention Score history
Activity
Mendeley demographics
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| Title |
Comparison between random and pseudo-random generation for BIST of delay, stuck-at and bridging faults
|
|---|---|
| Published by |
Institute of Electrical and Electronics Engineers (IEEE), January 2000
|
| DOI | 10.1109/olt.2000.856623 |
| Authors |
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Mendeley demographics
The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Italy | 1 | 14% |
| Brazil | 1 | 14% |
| Unknown | 5 | 71% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Bachelor | 2 | 29% |
| Professor | 2 | 29% |
| Student > Master | 1 | 14% |
| Researcher | 1 | 14% |
| Unknown | 1 | 14% |
| Readers by discipline | Count | As % |
|---|---|---|
| Computer Science | 3 | 43% |
| Engineering | 3 | 43% |
| Economics, Econometrics and Finance | 1 | 14% |